摘要:
近红外光谱(NIRS)技术是当前发展最快、最具前景的现代无损分析技术之一。NIRS技术融合了计算机、光学、数学、化学和化学计量学等多个学科的最新研究成果,具有简便、快速、低成本、无污染、不接触等优点,目前被广泛应用于食品品质分析与检测研究。本文综述了近十年来NIRS技术在小麦粉理化指标(如水分、灰分、蛋白质、淀粉)、粉质指标(如面筋、面筋指数分、沉降值、吸水量、形成时间、稳定时间、弱化度)及掺杂物(如甲醛次硫酸氢钠、滑石粉、过氧化苯甲酰、石灰、偶氮甲酰胺、曲酸)等方面的检测研究进展。同时,基于当前研究进展,NIRS技术在光谱数据挖掘、建模算法优化、模型稳健性等方面还需大量研究,为研发小麦粉质量快速无损检测设备提供更多数据支撑和方法参考。
Abstract:
Near-infrared spectroscopy(NIRS)is one of the current fastest developing and most promising modern nondestructive analysis technology. NIRS integrates the latest research achievements of computer,optics,mathematics,chemistry and chemometrics,and has the advantages of simplicity,rapid,low cost,no pollution,contactless,etc. At present,NIRS has been widely used in food quality analysis and detection research. In the paper,the research progresses of NIRS in wheat flour quality detection in the recent ten years concerning physicochemical indexes including moisture,ash,protein,starch,and powder quality indicators including gluten,gluten index,zeleny,water quantity,formation time,stability time and weakening degree,as well as adulterants including sodium formaldehyde sulfoxylate,talcum powder,benzoyl peroxide,lime,azodicarbonamide,kojic acid are reviewed. At the same time,based on the current research progresses,it still requires a lot of NIRS research in spectral data mining,modeling algorithm optimization and model robustness,which will provides more data support and method reference for the equipment development of wheat flour quality detection in a rapid and nondestructive way.
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